Beschreibung
InhaltsangabeP.G. Gucciardi, G. Bachelier, S.J. Stranick, and M. Allegrini: Background-free apertureless near-field imaging.- Hao-Chih (Bernard) Liu, Gregory A. Dahlen, Jason R. Osborne: Critical Dimension Atomic Force Microscopy for Sub-50 nm Microelectronics Technology Nodes.- E. Cefalì, S. Patanè, S. Spadaro, R. Gardelli, M. Albani, M. Allegrini: Near Field Probes: from optical fibers to optical nanoantennas.- Sophie Marsaudon, Charlotte Bernard, Dirk Dietzel, Cattien V. Nguyen, Anne-Marie Bonnot, Jean-Pierre Aime, Rodolphe Boisgard: Carbon Nanotubes as SPM Tips: Nanotube Tips Mechanical Properties and Imaging.- H.D. Espinosa and Andrea Ho: Scanning Probes for the Life Sciences.- Hayato Sone and Sumio Hosaka: Self-sensing cantilever sensor for bio-science.- Vinzenz Friedli, Samuel Hoffmann, Johann Michler, and Ivo Utke: AFM Sensors in Scanning Electron and Ion Microscopes: Tools for Nanomechanics, Nanoanalytics, and Nanofabrication.- Peter J. Cumpson, Charles Clifford, Jose Portoles, James Johnstone, and Martin Munz: Cantilever Spring Constant Calibration in Atomic Force Microscopy.- Suzanne P. Jarvis, John E. Sader, Takeshi Fukuma: Frequency Modulation Atomic Force Microscopy in Liquids.- Y. Rosenwaks, O. Tal, S. Saraf, A. Schwarzman, E. Lepkifker, and A. Boag: Kelvin Probe Force Microscopy: Recent Advances and Applications.- Stefan Lanyi: Application of Scanning Capacitance Microscopy to Analysis at the Nanoscale.- Laura Fumagalli, Ignacio Casuso, Giorgio Ferrari and Gabriel Gomila: Probing Electrical transport properties at the nanoscale by current-sensing Atomic Force Microscopy.-
